Gas & Water Vapor Transmittance Measurement Device - Contracted Analysis: Evaluation Cases
Evaluation Cases
Evaluation Cases 1
Reduced measurement time using the MA method
- Sample: Film for organic device substrate
- Test conditions: 40°C 90% RH
- Preprocessing conditions
(Base material) PET 100 μm
(Barrier layer) Organic/inorganic multiple layers
(One-sided barrier layer)
(MA method) None
(Differential pressure method) 80°C vacuum evacuation (12 hours)
Set to +40°C and wait for stabilization (6 hours)
The MA method enabled evaluation in 1 day for a measurement that required 5 days using the conventional differential pressure method. (Approximately 1/5 the measurement time compared to the conventional method)
Evaluation Cases 2
High-sensitivity water vapor permeability measurement
- Sample: Film for flexible OLED substrate
- Test conditions: 40°C 90% RH
- Measurement method: MA method
- Preprocessing conditions: 40°C vacuum evacuation (24 hours)
(Base material) PEN 125 μm
(Barrier layer) Organic/inorganic multiple layers
(One-sided barrier layer)
Through measurement using the MA method, it was possible to evaluate film with extremely high barrier properties at a level of 10-6g/m2/day in about 3 days.
Evaluation Cases 3
High-sensitivity gas permeability measurement
- Sample: Film for solar cell front sheet
- Test conditions: 40°C, O2 1atm supply
- Measurement method: Differential pressure method
- Preprocessing conditions: 80°C vacuum evacuation (12 hours)
Set to +40°C and wait for stabilization (6 hours)
(Base material) PET 60 μm
(Barrier layer) Organic/inorganic multiple layers
(WVTR10-3level)
The permeability of various gases can be measured with one device. (Water vapor, oxygen, nitrogen, helium, carbon dioxide, etc.)
In the evaluation cases, oxygen permeability was measured, and it was possible to evaluate approximately 10 hours after supplying oxygen.
By using other gases such as helium as a replacement for water vapor, one can expect significant reductions in time required for quality control of barrier film.
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